PinPoint II

The Pinpoint II provides the ability to quickly and reliably test and fault-find electronics circuits. Allowing you to select and apply different test techniques on a single circuit, you can ensure comprehensive fault coverage.

You select the best no-compromise test methods required to rapidly isolate the cause of failures in your circuit, ensuring rapid programming, fast turn-around times and minimising No Fault Found (NFF) scenarios.

TestVue, the easy-to-use intuitive software, allows you to access the full power of the PinPoint so that you can concentrate on testing the circuit and finding the fault quickly, reliably and confidently.

PinPoint II is a multi-strategy system for fault finding and testing circuit boards. It’s intuitive and fast to learn, providing maximum fault coverage, achieved through multiple test strategies. Interactive documentation and help facilities are included in the software, with maintenance and calibration instructions included in the system documentation.

This system tests all types of device technology using advance pin electronics. It has up to 240 digital dynamic test channels, and up to 15MHz data rate. High and consistent data rates ensure more thorough testing of a device to find more faults. Also, a number of features built in - DMM, waveform generator, oscilloscope, counter-time, shorts locator, Performance Test Module, LCR bridge, Analog Signature Analysis, Programmable power supplies - allow you to find more faults.

PinPoint II conforms to the Defence Standard 00-53 for safe test of any device. It includes an extensive library of device functional test routines including Western and Russian devices, and integral reverse engineering of schematic diagrams for testing circuits that don’t have information. Fixtureless tests allow for immediate use without requiring a test fixture to be made, and it easily integrates with instrumentation for extended analog functional testing.

Other features include an Instrument Strategizer which allows graphic programming of external integrated instruments, immediate graphic programming of instruments with VISA drivers and use of ‘C’ code within the graphical test program.

Test Methods include: